Proceedings, Femtosecond Electron Imaging and Spectroscopy 2013, Key West, Florida
AbstractThis volume comprises proceedings of the conference on
Femtosecond Electron Imaging and Spectroscopy
which was held on December 9-12, 2013 in Key West, Florida, USA.
The conference built on the potential synergy between related
technology developments and various emerging scientific opportunities
and brought together leaders engaged in cutting edge development of
high brightness electron and X-ray beam systems and their applications
to frontier science problems. FEIS 2013, the first in this series,
was organized with the goal of initiating conversation between
different communities with the objective of reviewing the current
state-of-the-art development and open issues of ultrafast electron
imaging technologies, and to assess emerging scientific opportunities
enabled by ultrafast imaging and spectroscopy. Furthermore,
a goal was to identify the key technical challenges in the design
and applications of ultrafast electron imaging systems, and to forge
cross-fertilization between the electron microscopy, accelerator and
beam physics, and ultrafast communities, and to have experimentalists
and theorists address common challenges and promote synergistic
M. Berz, P. Duxbury, K. Makino, C.-Y. Ruan (Eds.),
Advances in Imaging and Electron Physics 191,
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